题目：The changing landscape of micro/nanoelectronics

时间：2009年5月22日上午9：00

地点：武汉光电国家实验室A302

演讲人：Dr. G.Q .(Kouchi) Zhang

邀请人：刘胜教授

 

ABS:The changing landscape of micro/nanoelectronics

>In the past decades, the progresses of semiconductors are mainly powered by Moores law focusing on IC miniaturization down to nano scale, resulting in the transition from microelectronics into nanoelectronics. Recently, we have witnessed the quick development of a new area of Micro/nanoelectronics beyond the boundaries of Moores law, called "More than Moore" (MtM). MtM creates and adds various non-digital functionalities to semiconductor products and focuses on creating high value micro/nanoelectronics systems, leading to virtually unlimited technology possibilities and application potentials. In this talk, starting from society needs, Prof. Zhang (the creator of More than Moore) will highlight the major technology and business development trends,  and explain the vision and strategy. Some potential applications will also be demonstrated.

 

 

CV

Dr. G.Q .(Kouchi) Zhang  is senior director of NXP Semiconductors, working on technology strategy, roadmap and open innovation program. He is chairing  “More than Moore”  technology domain for European Technology Platform Nanoelectronics (Eniac); serves as deputy director for European Center for Micro- and Nano- Reliability (EUCEMAN); co-chair of academic council of Dutch national strategic innovation program for nanoelectronics, embedded systems and mechatronics . As an active player in European’s Micro/Nanoelectronics arena, Zhang has been leading and contributing to several European Commission and Dutch government funded R&D program, projects and initiatives.

 

As professor chairing micro/nanoreliability in Delft University of Technology, the Netherlands, he has authored/co-authored more than 150 scientific publications (including books and book chapters), and gave invited keynotes in many countries. He has been also chairing /co-chairing several international conferences, and serves as an associated editor for IEEE Transactions on CPT, member of editorial boards of Journal of Microsystem Technologies and Journal of Microelectronics Reliability.